Silicon solar cells and panels still remain as the most used for the installation of photovoltaic power plants due to their reduced cost and mature fabrication process. New cells are produced with increasing efficiencies by means of the introduction of ameliorated processing techniques as well as improvements in material quality. Determining the characteristics of the performance of those solar cells is essential to improve their optimization. Among other techniques, Impedance spectroscopy, as an AC characterization technique has been recognized as a valuable tool to obtain the transient response of charge carriers , which is not available when using only DC characterization. Bias dependent capacitance is one of the proposed techniques to obtain information on interface defects and on the carrier lifetime due to the fact that biasing or illuminating changes device dynamics, and that change becomes visible through capacitance variation. The aim of this work is using impedance spectroscopy (IS) in commercial photovoltaic (PV) solar cells to compare their performances.